3D Scans of the Substrate Typologies
Motivation and challenges
Just one single impression allows a very high number of data to be identified. In addition to the optical digital microscope, 3D scan technology can simplify or complement the determination of the relevant data. The 3D scans are precisely recorded and then converted into a three-dimensional image. This results in complete form and dimensional analyses of the substrate topologies.
Project insight and perspectives
In this step of the work, 3D scans are taken that create a spatial representation in the form of a 360 degree view. Through the dynamically changeable viewing angle, this inspection represents a good complement to the static images from the optical digital microscope. The digitised 3D models also provide a direct comparison of the different substrates, thus allowing possible similarities and differences to be identified.
Fraunhofer UMSICHT
Fraunhofer UMSICHT